January 19-20, 2017 - 2nd seminar on “Climatic reliability of electronics: Global challenges and perspectives”.
This seminar is organized by Center for Electronic Corrosion (CELCORR) and EFC Task Force on “Corrosion Reliability of Electronics” together with IPU.

We are pleased to announce the 2nd international seminar on the climatic reliability of electronics. Following last year’s success, the seminar will include 2 days program, with scientific presentations from industry and academia. There will be an extended focus on networking between participants during matchmaking sessions, and we introduce a session for invited state-of-the-art sub-suppliers to the electronics industries.

The seminar attracts delegates from academia and industry. We are delighted to invite you to attend this important seminar.During the two-day seminar there will be focus on establishing opportunities for participants to strengthen their networks. This is further strengthened with the matchmaking event where participants fill out a profile about their company/institution, and on what types of cooperation they are interested in. During January, participants can then book meetings /accept meeting requests from other participants. The duration of the matchmaking meetings are 20 min and can be held informally while enjoying the food and drinks.


Registration and more information here: http://bit.ly/2gBxwcS


Center management

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Prof. Rajan Ambat

Center Manager
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Dr. Morten S. Jellesen

Project coordinator

 Meet other members...

Electronic corrosion testing

Climatic conditions

Humidity and temperature variation in the use environment influences corrosion thus overall reliability of electronic device.

Ionic contamination

Flux residues and contamination determines threshold climatic conditions for leakage and corrosion.

Protection strategy

Understanding of failure mechanism and selection of a method for corrosion protection.

Corrosive gasses

Corrosive gasses such as H2S, SOx,COS, NOx in the use environment accelerates corrosion and failure of electronics.